Overview:
This instrument enables fast, non-destructive, and precise measurement of coatings and plating thickness. It is suitable for both laboratory and on-site engineering applications. By using different probes, it can meet various measurement requirements. The instrument is widely used in manufacturing, metal processing, chemical industries, and commercial inspection, making it an essential tool for material protection professionals.
Features:
- Fully Chinese menu interface for easy and convenient operation.
- Uses eddy current thickness measurement to non-destructively measure non-magnetic metal substrates (such as rubber, plastic, paint, and oxide films on aluminum, copper, zinc, tin, etc.).
- Two measurement modes: Continuous measurement (CONTINUE) and Single measurement (SINGLE).
- Two working modes: Direct mode (DIRECT) and Group mode (A-B).
- Provides five statistical values: Mean (MEAN), Maximum (MAX), Minimum (MIN), Number of Tests (NO.), and Standard Deviation (S.DEV).
- Multiple calibration methods: Basic instrument zeroing and five-piece calibration for system error correction.
- Storage function: Can store data for four types of workpieces, with 26 groups per workpiece type and 15 measurements per group, totaling 1560 measurement values.
- Deletion function: Allows deletion of individual suspicious measurement data or all stored data to facilitate new measurements.
- Limit setting: Automatically alarms when the measurement value exceeds the set limit.
- Audible beep prompts during operation.
- High-brightness LED backlight display for easy use in dim lighting conditions.
- Two shutdown modes: Manual and automatic shutdown.
Technical Specifications:
| Parameter | Specification |
|---|---|
| Model | Dor Yang 271 |
| Probe Type | N1 |
| Operating Principle | Eddy Current NFe |
| Measurement Range | 0-1250µm |
| Minimum Resolution | 0.1µm |
| Indication Error | ±(3%H+1) (H is the actual measured thickness) |
| Statistical Functions | Mean (MEAN), Maximum (MAX), Minimum (MIN), Number of Tests (NO.), Standard Deviation (S.DEV) |
| Working Modes | Direct mode (DIRECT) and Group mode (Appl) |
| Measurement Modes | Continuous measurement (CONTINUE) and Single measurement (SINGLE) |
| Storage Capacity | 1560 measurement values |
| Display | Black & White |
| Testing Conditions | |
| Minimum Curvature Radius | Convex: 1.5mm, Concave: 9mm |
| Minimum Measurement Area Diameter | Φ7mm |
| Critical Base Thickness | 0.5mm |
| Operating Environment | |
| Temperature | 0~40℃ |
| Humidity | 20%~90% |
| Power Supply | 2 * 1.5V batteries |
| Dimensions | 163 × 78 × 33mm |
| Weight | 200g |
| Standard Accessories | Main unit, standard test pieces, substrate, batteries, documentation, instrument case |
| Optional Accessories | Substrate, test pieces, leather case, probe |
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